Fig. 5From: Microscopic and chemical analysis of room temperature UV laser annealing of solution-based zinc-tin-oxide thin filmsa Low magnification TEM image of ZTO thin films on SiO2/Si substrate. The film is grown in uniform thickness of 40 nm. b TEM image of ZTO film. Some dark contrast regions are observed near the film/substrate interface. c High magnification image of ZTO film, showing some nanocrystalline phasesBack to article page