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Fig. 6 | Journal of Analytical Science and Technology

Fig. 6

From: Material structure, properties, and dynamics through scanning transmission electron microscopy

Fig. 6

Simultaneously acquired atomic-resolution STEM images of SrTiO 3 [001]. a ADF STEM image. b Projected electric field vector color map (left side) and electric field strength map (right side) constructed from the segmented-detector STEM images. The inset color wheel indicates how color and shade denote the electric field orientation and strength in the vector color map. It is seen that both heavy and light element columns are sensitively imaged. Intensity dips are clearly visible at the center of each atomic column position. Images taken with a JEOL ARM-300CF operating at 300 kV, adapted from Shibata et al. 2017

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