Fig. 5
From: Hf-W dating of zircon in mesosiderite with high-pressure sintered standard
Comparison of Hf/W ratios measured by LA-ICPMS and NanoSIMS in sintered zircon standard. a Observed data for standard A. Mixing ratio of Hf/W was 933, while the measured ratio was 344, suggesting a W contamination. Bars show 2σ errors. NanoSIMS data are larger than those of LA-ICMPS. b Observed data for standard B. Mixing ratio of Hf/W is 9.06. LA-ICPMS data are consistent with the mixing ratio. Bars show 2σ errors. NanoSIMS data are again larger than those of LA-ICMPS