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Fig. 1 | Journal of Analytical Science and Technology

Fig. 1

From: Nanoscale analysis of noble gas in solids

Fig. 1

Photograph and schematic image of LIMAS. Configuration of primary and secondary columns and sample holder is inserted. The primary beam is irradiated onto the sample surface at an incident angle of 35° to the sample surface as shown in the inserted picture. Note that the configuration between the primary beam and the sample in the schematic drawing is not correct

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