Fig. 2From: Deep learning image segmentation for the reliable porosity measurement of high-capacity Ni-based oxide cathode secondary particlesInput image dataset prepared for deep learning. a Example image array of original image dataset (256 × 256 pixels) obtained at different depths in the NCM secondary particle through SEM–FIB serial sectioning and postprocessing. The depth interval between each slice number is 15 nm. b, c Image datasets generated after histogram stretching and histogram equalization, respectivelyBack to article page