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Journal of Analytical Science and Technology
Fig. 3 | Journal of Analytical Science and Technology

Fig. 3

From: exCTF simulator: Simulation tool for phase contrast transfer function for aberration-corrected transmission electron microscopy

Fig. 3

CTF calculation results with optical aberration parameters required to achieve an information limit of 0.1 nm for a TEM operating at 200 kV. a Calculation results for 1D-CTF and 2D-CTF with specific instrumental parameters for the AC-TEM and set optical aberration parameters. b Complete and elemental 2D-CTF images obtained using the exCTF simulator. The inset red circle in the complete 2D-CTF image indicates an information limit of 0.1 nm

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