Skip to main content
Journal of Analytical Science and Technology
Fig. 2 | Journal of Analytical Science and Technology

Fig. 2

From: exCTF simulator: Simulation tool for phase contrast transfer function for aberration-corrected transmission electron microscopy

Fig. 2

CTF calculation results of a HVEM operating at 1250 kV. a Results for 1D-CTF obtained by editing the saved calculation result spreadsheet. The red arrow indicates the Scherzer cutoff frequency, i.e., the point resolution of the simulated TEM, and its value is 8.6 nm−1 (0.116 nm), while the blue arrow indicates the corresponding information limit with a value of 12.44 nm−1 (0.08 nm). b Corresponding saved 2D-CTF images obtained using the CTF simulator. The inset line profile in the 2D-CTF image is identical to the 1D-CTF result

Back to article page