From: Analytical effect of stabilizer volume and shape on zircon U–Pb dating by nanosecond LA-ICP-QMS
ICP-MS | Agilent 7700x | Laser ablation | Analyte excite |
---|---|---|---|
RF power, W | 1450 | Laser type | ArF excimer |
Plasma gas, L/min Ar | 15.0 | Wavelength, nm | 193 |
Auxiliary gas, L/min Ar | 1.0 | Pulse duration, ns | 5 |
Make-up gas, L/min Ar | 0.8 | Repetition rate, Hz | 5 |
Detector mode | Dual | Fluence, J/cm2 | 5.9 |
Scan mode | Peak jumping | Spot size, µm | 35 |
Settling time, ms | 1 | Sampling strategy | Single spot |
Sweeps/reading | 1 | Pulses/spot | 200 |
Data collecting mode | TRA | Carrier gas, L/min He | 0.2 Inner cup 0.6 Main volume |
Sampling depth, mm | 5 |