Fig. 4From: Development of SEM and STEM-in-SEM grid holders for EDS analysis and their applications to apatite phasesCorrelation of the O and P intensities for the reference materials obtained at 15 kV and 5 kV using the Mini-SEM. Data points obtained at 5 kV are closer to the linear line than those at 15 kV. The increased R2 (coefficient of determination) at 5 kV suggests improvement of data reliabilityBack to article page