Fig. 20
From: Material structure, properties, and dynamics through scanning transmission electron microscopy
Simulated focal series of images of Ce atoms substituted in AlN for probe-forming angles of 30 (upper), 60 (center), and 100 (lower) mrad at 300Â kV accelerating voltage, assuming aberration-free conditions. Ce atom locations are indicated by red rectangles. Reproduced from Ishikawa et al. 2015. Copyright 2014, with permission from Elsevier