Fig. 10From: Material structure, properties, and dynamics through scanning transmission electron microscopy EDX images of a near-atomically abrupt SrTiO 3 /LaAlO 3 interface showing atomic columns identified as labeled, with 10Â min total acquisition using an Oxford X-Max 100TLE detector on a JEOL ARM200 equipped with ASCOR aberration corrector operated at 200Â kV. The composite image includes all edges except O, top right is the HAADF image. Data courtesy Mengsha Li Back to article page