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Journal of Analytical Science and Technology
Fig. 4 | Journal of Analytical Science and Technology

Fig. 4

From: Microstructural and microchemical analysis of zircon in a syenite lithic fragment from Ulleung Island volcano, South Korea

Fig. 4

a Enlarged GROD map of grain A13 showing both low-angle boundary and gradual lattice bending in the upper part and lower part of the map, respectively. The red and yellow lines in (a) indicate location of cumulative misorientation profiles shown in (b). b Cumulative misorientation profiles for the red and yellow lines shown in (a). The red line illustrates the low-angle boundary with steep lattice distortion, while the yellow line represents the gradual lattice bending with continuous lattice distortion

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